BARRIER FILM MATERIAL AND PATTERN FORMATION METHOD USING THE SAME

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United States of America Patent

SERIAL NO

12466769

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Abstract

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A resist film made of a chemically amplified resist is formed on a substrate. Subsequently, a barrier film for preventing a component of the resist film from eluting into an immersion liquid or preventing the immersion liquid from permeating into the resist film is formed on the resist film. Thereafter, with an immersion liquid provided on the barrier film, pattern exposure is carried out by selectively irradiating the resist film with exposing light through the barrier film. Then, after removing the barrier film, the resist film having been subjected to the pattern exposure is developed, so as to form a resist pattern made of the resist film.

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Patent Owner(s)

Patent OwnerAddress
RPX CORPORATIONFOUR EMBARCADERO SUITE 4000 SAN FRANCISCO CA 94111

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Endo, Masayuki Osaka , JP 209 3769
Sasago, Masaru Osaka , JP 214 3413

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