LIGHT-EMITTING DEVICE ON-WAFER TEST SYSTEMS AND METHODS

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United States of America Patent

APP PUB NO 20090236506A1
SERIAL NO

12275040

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Abstract

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On-wafer test systems and methods for light-emitting devices, such as light-emitting diodes (LEDs), are provided. The test system may be designed, for example, to characterize the light output from the LED die (e.g., power in Lumens).

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Patent Owner(s)

Patent OwnerAddress
LUMINUS DEVICES INC1100 TECHNOLOGY PARK DRIVE BILLERICA MA 01821

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Brown, Michael G Tyngsboro , US 28 800
Dudgeon, Robert G Londonderry , US 1 17
Karlicek,, JR Robert F Chelmsford , US 29 291

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