Roundness Measuring Instrument and Method of Determining Quality of Tip Head
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United States of America Patent
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N/A
Issued Date -
Oct 15, 2009
app pub date -
Dec 1, 2006
filing date -
Dec 5, 2005
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
that processes the measurement data, wherein the processing controller calculates a roundness by correcting a shift of the contact position of the surface of the object to be measured and the tip head in the first plane due to eccentricity between the center of the object to be measured and the center of rotation of the mount base, and further, the processing controller calculates a roundness by calculating a shift due to eccentricity of the contact position in a direction perpendicular to the first plane and also correcting a shift of the contact position due to the calculated shift in the first plane.
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