Thermal structure for sample processing systems
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United States of America Patent
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Aug 23, 2011
Grant Date -
Oct 22, 2009
app pub date -
Jun 25, 2009
filing date -
Dec 28, 2001
priority date (Note) -
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Abstract
Sample processing systems for processing sample materials located in sample processing devices that are separate from the system are disclosed. The sample processing systems include a rotating base plate with raised and/or non-planar thermal structures on which the sample processing devices are located during operation of the systems. The systems may also include structure to urge the sample processing devices against the base plate and thermal structures.
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