ION BEAM IRRADIATION APPARATUS AND ION BEAM MEASURING METHOD

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20090283703A1
SERIAL NO

12468625

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A beam profile monitor is disposed on an orbit of an ion beam, and measures a beam intensity distribution of the ion beam. A pair of beam blocking members are opposed to each other across the ion beam in the x direction, and forms an opening through which the ion beam passes: At least one of the beam blocking members includes a plurality of movable blocking plates disposed without forming a gap in the y direction, and in an independently reciprocable manner in the x direction. A minute opening is formed between the beam blocking members opposed to each other by adjusting the positions of the beam blocking members. From a result of the intensity distribution measurement which is performed by said beam profile monitor on the ion beam passed through the minute opening, the emittance of the ion beam is calculated.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
NISSIN ION EQUIPMENT CO LTD29 HINOKIGAOKA MINAKUCHI-CHO KOKA-CITY SHIGA 528-0068

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Tamura, Shigehisa Kyoto , JP 4 7

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation