Test method and device for land grid array components
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United States of America Patent
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Issued Date -
Nov 19, 2009
app pub date -
May 16, 2008
filing date -
May 16, 2008
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A test method for Land Grid Array components includes the steps of: providing a test board with a plurality of test points; providing a secondary test board which has a plurality of conductors extending therethrough from a top surface to a bottom surface and forms a drop thereon, placing the secondary test board on the test board and contacting the conductors with the test points correspondingly; disposing a conducting spacer on the secondary test board, which is contacted with the conductors of the secondary test board correspondingly; and placing a test object on the conducting spacer, which has a plurality of conducting terminals contacted with the conducting spacer, and pressing the test object downwards so that the conducting terminals, the conducting spacer, the conductors and the test points are electrically connected for testing the test object. A test device for Land Grid Array components also is provided.
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Cited Art Landscape
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