Dynamically estimating lifetime of a semiconductor device
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United States of America Patent
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Apr 3, 2012
Grant Date -
Nov 19, 2009
app pub date -
Dec 30, 2005
filing date -
Dec 30, 2005
priority date (Note) -
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Abstract
The present invention includes a method for obtaining dynamic operating parameter information of a semiconductor device such as a processor, determining dynamic usage of the device, either as a whole or for one or more portions thereof, based on the dynamic operating parameter information, and dynamically estimating a remaining lifetime of the device based on the dynamic usage. Depending on the estimated remaining lifetime, the device may be controlled in a desired manner.
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