System and Method for Synchronized Measurements
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United States of America Patent
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Issued Date -
Nov 26, 2009
app pub date -
May 23, 2008
filing date -
May 23, 2008
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A system and method of synchronizing measurements between a master monitor (130 and/or 132) and a slave monitor (154 and/or 164). A system controller (110) receives master samples representing a signal characteristic from the master monitor (130 and/or 132) and slave samples representing the signal characteristic from the slave monitor (154 and/or 164). The master samples and slave samples are aligned using correlation analysis to obtain the identification of a slave sample that aligns with a predetermined master sample. This identification is transmitted to the slave monitor and used to synchronize a master measurement with a slave measurement.
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