Integrated circuit with inter-symbol interference self-testing
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United States of America Patent
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Issued Date -
Nov 26, 2009
app pub date -
May 23, 2008
filing date -
May 23, 2008
priority date (Note) -
Abandoned
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Abstract
which processes an input test serial data signal to generate an output test serial data signal having enhanced inter-symbol interference for loopback to the data receiver circuit so as to test that data receiver circuit.
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