Testing method of an IC card including a ZigBee device
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United States of America Patent
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Feb 28, 2012
Grant Date -
Dec 10, 2009
app pub date -
Mar 27, 2009
filing date -
Mar 28, 2008
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A method for testing a ZigBee device included in an IC Card includes associating a predetermined Personal Area Network (PAN) Identifier to the ZigBee device, and providing a test device, for initializing a ZigBee network. The method may include connecting the ZigBee device to the ZigBee network and transmitting the corresponding PAN Identifier to the test device. The method may include returning a fault message, indicative of a failure of connecting and transmitting, if the test device does not receive the PAN Identifier. The predetermined PAN Identifier may be stored in a memory portion of the test device and include, in the fault message, the PAN Identifier if the test device does not receive the PAN Identifier, in order to identify the ZigBee device as a defective device.
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