PROBE AND PROBE CARD FOR INTEGRATED CIRCUIT DEVICES USING THE SAME
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United States of America Patent
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N/A
Issued Date -
Dec 24, 2009
app pub date -
Sep 25, 2008
filing date -
Jun 18, 2008
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A vertical probe comprises a linear body, a tip portion connected to one side of the linear body, and at least one slot positioned on the linear body. In particular, the vertical probe includes a depressed structure having a plurality of slots positioned on the linear body in parallel and on one side of the linear body. The present application also provides a probe card for integrated circuit devices comprising an upper guiding plate having a plurality of fastening holes, a bottom guiding plate having a plurality of guiding holes and a plurality of vertical probes positioned in the guiding holes. The vertical probe includes a linear body positioned in the guiding holes, a tip portion connected to one side of the linear body and at least one slot positioned on the linear body.
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