TEST STRIP WITH OPTICAL IDENTIFICATION PATTERNS AND TEST INSTRUMENT USING THE SAME
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United States of America Patent
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Issued Date -
Jan 21, 2010
app pub date -
Jul 15, 2008
filing date -
Jul 15, 2008
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The present invention discloses a test strip with optical identification patterns and a test instrument using the same characterized in that the test strip incorporates an identification area. Different combinations of optical identification patterns on the identification area create different digital identification signals. After the test strip is inserted into the test instrument, the test instrument will obtain the digital identification signal and learn the test code, analysis parameters, expiry date and batch number of the test strip. Thereby, the test instrument can verify the batch number and expiry date of the test strip, perform calibration according to the analysis parameters, and provide a correct test result. The present invention can provide many sets of digital identification signals to differentiate test strips. Therefore, the present invention can be operated fast, conveniently and correctly and can prevent a user from forgetting to calibrate the test instrument.
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