CHARACTERIZING A COMPUTER SYSTEM USING RADIATING ELECTROMAGNETIC SIGNALS MONITORED THROUGH AN INTERFACE

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United States of America Patent

APP PUB NO 20100023282A1
SERIAL NO

12177724

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Abstract

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Some embodiments of the present invention provide a system that characterizes a computer system parameter by analyzing a target electromagnetic signal radiating from the computer system. First, the target electromagnetic signal is monitored using a conductor in an interface of the computer system. Then, the target electromagnetic signal is analyzed to characterize the computer system parameter.

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SUN MICROSYSTEMS INCMOUNTAIN VIEW CA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dhanekula, Ramakrishna C San Diego, US 32 678
Gross, Kenny C San Diego, US 271 2980
Lewis, Andrew J Litchfield, US 19 375
Urmanov, Aleksey M San Diego, US 110 1192

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