PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL
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United States of America Patent
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Issued Date -
Feb 25, 2010
app pub date -
Aug 11, 2009
filing date -
Aug 19, 2008
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A probe for temporarily electrically contacting a solar cell for testing purposes, has at least one elastic, electrically conductive contact element for producing the electrical contact, at least one reference sensor for indicating a distance of the contact element to an external reference surface using an electrical signal of the reference sensor, and a mounting plane to which the tip of the contact element is oriented. The probe ensures a secure electrical contact of the solar cell in a testing station with minimal mechanical stress, and is also suitable for use in an industrial continuous production method.
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