APPARATUS FOR THE DYNAMIC DETECTION, SELECTION AND DESELECTION OF LEAKING DECOUPLING CAPACITORS
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United States of America Patent
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Issued Date -
Apr 1, 2010
app pub date -
Sep 26, 2008
filing date -
Sep 26, 2008
priority date (Note) -
Abandoned
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Abstract
Embodiments of the invention generally provide methods, systems, and apparatus for testing decoupling capacitors of an integrated circuit. A decoupling capacitor may be disconnected from the power grid of the integrated circuit during testing. The voltage of the decoupling capacitor may be compared to the voltage of a reference capacitor to determine whether the decoupling capacitor is defective. If the decoupling capacitor is determined to be defective, the decoupling capacitor is not reconnected to the power grid, thereby reducing the leakage currents in the integrated circuit.
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