PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITS
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United States of America Patent
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app pub date -
Oct 30, 2009
filing date -
Apr 3, 2006
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Abandoned
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Abstract
In a method for measurement of impedance of electronic circuits, an input of the electronic circuit is acted upon by a high-frequency ac voltage with a measurement frequency f as a test signal and, from the reaction of the circuit to the test signal, the impedance Z of the circuit is determined. A parameter S, which represents the value, and from this parameter S the impedance Z is determined. To minimize the error in measuring the impedances by determining parameter S, the measurement frequency f is set so that a minimal error ΔZ is produced for Z.
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