Process For Manufacturing Contact Elements For Probe Card Assembles
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United States of America Patent
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Issued Date -
Jun 10, 2010
app pub date -
May 22, 2009
filing date -
Dec 8, 2008
priority date (Note) -
Abandoned
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Abstract
A process for making contact elements for a probe card assembly includes steps of forming a first continuous trench in a substrate along a first direction, and forming simultaneously a plurality of tip structures adjacent one to another in the first continuous trench in a second direction substantially normal to the first direction, each of the tip structures being part of, or adapted to be part of at least one corresponding contact element capable of forming an electrical contact with a terminal of an electronic device.
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