APPARATUS AND METHOD FOR SUBSTRATE HANDLING

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United States of America Patent

APP PUB NO 20100204820A1
SERIAL NO

12602770

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Abstract

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A system for substrate handling proposed, comprising an optical local tilt detector, a plurality of arms each having vertically extended movable along vertical axis fingers to contact the edge of a substrate, wherein at least one of the arms has a linear actuator moveable arm and each of the fingers provided by z-axis miniature linear actuator; and a control unit connected to said tilt detector and said z-axis linear actuators enabling measuring and correcting of local tilt.

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Patent Owner(s)

Patent OwnerAddress
NOVA MEASURING INSTRUMENTS LTDP O BOX 266 WEIZMANN SCIENCE PARK REHOVOT 7610201

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Finarov, Moshe Rehovot, IL 104 1587
Schulman, Beniamin Rehovot, IL 1 4

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