DEVICE FOR MEASURING STRUCTURES OF AN OBJECT
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United States of America Patent
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Issued Date -
Sep 9, 2010
app pub date -
Dec 20, 2006
filing date -
Jan 19, 2006
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A device for measuring structures of an object. The device includes a probe element extending from a probe extension, an optical sensor for capturing an image of the probe element on a sensor field, an evaluation unit configured to compute the structures based on a position of the optical sensor relative to a coordinate system of a coordinate measuring machine and from a position of the probe element measured by the optical sensor. The device also includes a lens disposed on the probe extension between the optical sensor and the probe element.
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