TEST STRUCTURE AND PROBE FOR DIFFERENTIAL SIGNALS

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United States of America Patent

SERIAL NO

12816628

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Abstract

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A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.

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Patent Owner(s)

Patent OwnerAddress
CASCADE MICROTECH INC9100 SW GEMINI DRIVE BEAVERTON OR US 97008

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Campbell, Richard Portland, US 33 276

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