DIFFERENTIAL SIGNAL PROBING SYSTEM

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United States of America Patent

SERIAL NO

12816648

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Abstract

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A probe measurement system comprises a probe with a linear array of probe tips enabling a single probe to be used when probing a test structure with a differential signal

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Patent Owner(s)

Patent OwnerAddress
CASCADE MICROTECH INC9100 SW GEMINI DRIVE BEAVERTON OR US 97008

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Campbell, Richard Portland, US 33 276
Strid, Eric Portland, US 12 114

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