PLASMA UNIFORMITY CONTROL THROUGH VHF CATHODE GROUND RETURN WITH FEEDBACK STABILIZATION OF VHF CATHODE IMPEDANCE

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United States of America Patent

APP PUB NO 20110005679A1
SERIAL NO

12502005

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Abstract

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Plasma process uniformity is controlled by maintaining near an optimum value an impedance of a ground return path for VHF source power from an overhead electrode through a workpiece support. A feedback control loop controls a variable reactance element of a reactive circuit that provides isolation between the VHF source power and a lower frequency bias power match circuit.

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Patent Owner(s)

Patent OwnerAddress
APPLIED MATERIALS INC3050 BOWERS AVENUE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HANAWA, HIROJI Sunnyvale, US 152 17795
Kobayashi, Satoru Mountain View, US 226 3972
Ramaswamy, Kartik San Jose, US 371 20119

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