SIFT-MS INSTRUMENT
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United States of America Patent
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Issued Date -
Feb 3, 2011
app pub date -
Oct 19, 2007
filing date -
Oct 19, 2006
priority date (Note) -
Abandoned
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Abstract
A method of improving signal intensity of precursor ions constrained in a carrier gas in the flow tube of a SIFT-MS instrument, and an apparatus to carry out the method. The method applies an electrical potential to the flow tube to lower the diffusive loss of ions within the flow tube. The lowered diffusive loss of ions increases the sensitivity of the technique.
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