METHOD FOR MEASURING HYPOCHLORITE ION

United States of America Patent

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Oct 22, 2010
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May 14, 2003

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Abstract

A method for measuring hypochlorite ion, which comprises the steps of:(A) reacting, with hypochlorite ion, a compound represented by the following general formula (I):(B) measuring fluorescence of a dearylated compound generated in the aforementioned step (A) or a salt thereof.

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Patent Owner(s)

Patent Owner	Address
NAGANO TETSUO	TOKYO

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G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....

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Inventor Name	Address	# of filed Patents	Total Citations
NAGANO, Tetsuo	Tokyo, JP	89	406
SETSUKINAI, Ken-ichi	Tokyo, JP	6	15
URANO, Yasuteru	Kanagawa, JP	66	174

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METHOD FOR MEASURING HYPOCHLORITE ION

Number of patents in Portfolio can not be more than 2000

United States of America Patent

12910457

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12910457

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