METHOD AND DEVICE FOR THE SPECTROMETRIC MEASUREMENT OF A MATERIAL FLOW MOVING IN THE LONGITUDINAL DIRECTION

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United States of America Patent

APP PUB NO 20110096325A1
SERIAL NO

12906368

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Abstract

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A method for the spectrometric measurement of a material flow moving in the longitudinal direction, that includes illumination of an illumination area (1b) on the material flow (10) via an illumination beam (1b) generated in a radiation source (1), at least partial collection of the radiation reflected in a measurement area (2b) on the material flow (10) via optical components and forwarding it to a spectrometer. The illumination area (1b) essentially overlaps the measurement area (2b) and the illumination and measurement areas are stationary in the longitudinal direction. Spectrometric analysis of the radiation guided to the spectrometer is carried out. By rotation of a rotating element (4), both the illumination area and also the measurement area (1b, 2b) are displaced simultaneously along a specified section extending perpendicular to the longitudinal direction, and at least the measurement area (2b) is forwarded to the spectrometer by an optical deflection element (4a) that is arranged on the rotating element (4) and between the measurement area and spectrometer in the beam path of a measurement beam (2a). The radiation source (1) and spectrometer are stationary at least in terms of translating motion in the longitudinal and transverse directions. A device for the spectrometric measurement is also provided.

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Patent Owner(s)

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POLYTEC GMBHPOLYTEC-PLATZ 1-7 WALDBRONN 76337

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Henzi, Patric Karlsruhe, DE 3 4
Hettwer, Dirk Waldbronn, DE 2 7
Nolte, Jens Gottingen, DE 2 0
Sebold, Andreas Weingarten, DE 1 0

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