Interface Adapter For Connecting With A Test Probe

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United States of America Patent

APP PUB NO 20110109340A1
SERIAL NO

12787852

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A interface adapter comprising a connecting board having the first ports and the second ports, the first ports being electrically connected with the second ports; a pin header having the first pins and the second pins, the first pins passing through the first ports, the second pins being connected with the second ports; a female header having openings for receiving the first pins, the connecting board being located between the pin header and the female header. The second pin is designed to O-shape or U-shape for providing enough position to connecting the test probe, preventing from disengagement of the chip from the test card.

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Patent Owner(s)

Patent OwnerAddress
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATIONNO 18 WEN CHANG RD ECONOMIC-TECHNOLOGICAL DEVELOPMENT AREA DAXING DISTRICT BEIJING 100716

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cui, Super Shanghai, CN 1 0
Xiong, Bear Shanghai, CN 1 0

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