Method for decoding data in non-volatile storage using reliability metrics based on multiple reads

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United States of America Patent

PATENT NO 8468424
APP PUB NO 20110131473A1
SERIAL NO

13024676

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Abstract

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Data stored in non-volatile storage is decoded using iterative probabilistic decoding and multiple read operations to achieve greater reliability. An error correcting code such as a low density parity check code may be used. In one approach, initial reliability metrics, such as logarithmic likelihood ratios, are used in decoding read data of a set of non-volatile storage element. The decoding attempts to converge by adjusting the reliability metrics for bits in code words which represent the sensed state. If convergence does not occur, e.g., within a set time period, the state of the non-volatile storage element is sensed again, current values of the reliability metrics in the decoder are adjusted, and the decoding again attempts to converge.

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Patent Owner(s)

  • SANDISK TECHNOLOGIES LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chin, Henry Palo Alto, US 106 1951
Mokhlesi, Nima Los Gatos, US 194 9358
Zhao, Dengtao Sunnyvale, US 66 1335

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