SCREENING METHODS FOR HEAT-SHOCK RESPONSE MODULATORS

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United States of America Patent

APP PUB NO 20110166038A1
SERIAL NO

12994703

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Abstract

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High-throughput methods are provided for quantitatively measuring the modulation of heat shock protein (HSP) expression in a cell by exposing the cell to at least one stress and measuring cellular stress responses. High-throughput methods for identifying modulators (activators or inhibitors) of HSP or HSF expression in a cell by treating the cell with an agent, such as a compound or composition, exposing the cell to a stress, and measuring responses of the cell to the stress in the presence or absence of the agent are also provided. Devices useful in performing high-throughput methods of the invention, and modulators identified using such methods, are also provided.

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Patent Owner(s)

Patent OwnerAddress
CYTRX CORPORATION11726 SAN VICENTE BLVD SUITE 650 LOS ANGELES CALIFORNIA 90049 UNITED STATES OF AMERICA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Au, Qingyan Anaheim, US 2 10
Ng, Shi Chung San Diego, US 5 67
Zhang, Bin San Diego, US 707 5717

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