INTEGRATED MULTI-SENSOR NON-DESTRUCTIVE TESTING
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United States of America Patent
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Issued Date -
Jul 14, 2011
app pub date -
Jun 29, 2009
filing date -
Jun 27, 2008
priority date (Note) -
Abandoned
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Abstract
Methods and apparatus for acquiring and processing data from a plurality of different sensor types for non-destructive testing of metallic structures. An electromagnetic acoustic transducer (EMAT) signal, an eddy current (EC) signal, a magnetic flux leakage (MFL) signal, and a deflection signal are acquired from each of a plurality of localized regions of a metallic structure, and are processed to characterize one or more features of the metallic structure based on at least two of the EMAT, EC, MFL, and deflection signals acquired from a common localized region in which at least a portion of the feature is located. An integrated multi-sensor device for non-destructive may be used to provide the EC, EMAT, MFL, and deflection signals for each of the plurality of localized regions of the metallic structure. Such integrated multi-sensor devices may be configured to provide an in-line inspection tool, such as an intelligent pig that is used to inspect the integrity of pipelines.
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