The invention relates to the operation of illuminants, in particular OLEDs. The invention relates to a method and a measuring instrument for determining the electrical properties of an OLED, the equivalent circuit diagram of which is composed of the parallel connection of an equivalent diode DE and an equivalent capacitance CE as well as an equivalent resistance RE that is connected in series to said parallel connection. The values for the equivalent resistance RE and the equivalent capacitance CE are determined at a different time than are the values for the equivalent diode DE.
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