Apparatus and Method for Quantatively Measuring Liquid Film Drying Rates on Substrates

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United States of America Patent

SERIAL NO

12984367

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Abstract

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An apparatus and method for measuring the drying rate of a liquid or liquid film in air or other gaseous media by either: a) measuring changes in the print density of the liquid; b) measuring changes in the dynamic surface tension of the liquid; c) measuring the differential pressure between an inert gas required to displace a sample of the liquid drawn into a capillary tube from a reservoir of the liquid and the pressure required for a bubble of the gas to form in the reservoir; and d) measuring the electrical conductance or resistance of the liquid.

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Patent Owner(s)

Patent OwnerAddress
SUN CHEMICAL CORPORATIONPARSIPPANY NJ 07054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Biro, David Rockaway, US 11 46
Laksin, Mikhail Boonton, US 39 310
Pace, Gregory Wood-Ridge, US 3 8
Parris, Juanita Montvale, US 14 22
Smith, Doreen Belleville, US 6 77
Sprycha, Ryszard Wallington, US 5 12

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