Optical measurement apparatus including hemispherical optical integrator

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8422018
APP PUB NO 20110205541A1
SERIAL NO

13029067

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.

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Patent Owner(s)

Patent OwnerAddress
OTSUKA ELECTRONICS CO LTDOSAKA

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ohkubo, Kazuaki Kusatsu, JP 35 226
Osawa, Yoshihiro Moriyama, JP 10 74

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