System and method for storing metrics in a database

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United States of America Patent

PATENT NO 10204173
APP PUB NO 20110219043A1
SERIAL NO

13108915

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Abstract

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A system and method for storing data associated with an extensible instrumentation layer. The method may include receiving metrics from an extensible instrumentation layer in an operating system. The metrics are defined by at least one class and a plurality of properties, with each property being associated with one class. The metrics are converted into at least one database-compliant data structure and stored in a database.

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Patent Owner(s)

  • CA, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Vaught, Jeffrey A Batavia, US 7 282

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