DEFECT CAPPING FOR REDUCED DEFECT DENSITY EPITAXIAL ARTICLES

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20110221039A1
SERIAL NO

12723309

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

that is ≧ two times lower than an average crystalline defect density in that area at or below the substrate surface.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
ENTEGRIS INC129 CONCORD ROAD BILLERICA MA 01821

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arjunan, Arul Chakkaravarthi Gainesville, US 12 89
Singh, Deepika Gainesville, US 27 254
Singh, Rajiv K Gainesville, US 44 794

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation