Quantum efficiency measurement method, quantum efficiency measurement apparatus, and integrator
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United States of America Patent
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Apr 9, 2013
Grant Date -
Sep 22, 2011
app pub date -
Feb 24, 2011
filing date -
Mar 18, 2010
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Abstract
A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.
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Patent Owner(s)
| Patent Owner | Address | |
|---|---|---|
| OTSUKA ELECTRONICS CO LTD | OSAKA |
International Classification(s)
Inventor(s)
| Inventor Name | Address | # of filed Patents | Total Citations |
|---|---|---|---|
| Ohkubo, Kazuaki | Kusatsu, JP | 35 | 226 |
| Osawa, Yoshihiro | Moriyama, JP | 10 | 74 |
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| Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
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