Quantum efficiency measurement method, quantum efficiency measurement apparatus, and integrator

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8415639
APP PUB NO 20110226961A1
SERIAL NO

13033612

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
OTSUKA ELECTRONICS CO LTDOSAKA

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ohkubo, Kazuaki Kusatsu, JP 35 226
Osawa, Yoshihiro Moriyama, JP 10 74

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation