UV-VIS ATR SHORT PATHLENGTH SPECTROSCOPY OF PRINTING INKS
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United States of America Patent
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Issued Date -
Sep 22, 2011
app pub date -
Nov 12, 2009
filing date -
Nov 11, 2008
priority date (Note) -
Abandoned
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Abstract
A spectroanalytic system and process for analyzing the absorption properties of highly absorbing viscous materials is disclosed. The measurement probe includes a UV-VIS optical system. A single crystal is shaped so that the light enters the crystal perpendicular to its surface and is Incident on the back face at an angle of 45 degree or greater and the reflected light is collected and channeled to a detector system. This system provides an attenuated total reflectance measurement with minimal reflection points wherein the total path length is comparable with a typically printed offset ink film (0.7-1.3 micron). The total absorption process path length depends only on the refractive index of the chosen crystal and on the angle of incidence of the single reflection. High refractive index materials, like diamond, have path lengths of 50 nm, and an economical material such as cubic zirconium provides a path length of 0.1 micron.
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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
SUN CHEMICAL CORPORATION | 35 WATERVIEW BOULEVARD PARSIPPANY NJ 07054 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Lee, Kathryn | Basking Ridge, US | 1 | 0 |
Rich, Danny Clark | Hamilton Square, US | 2 | 1 |
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Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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