Automatic determination of dynamic threshold for accurate detection of abnormalities

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United States of America Patent

PATENT NO 8457928
APP PUB NO 20110238376A1
SERIAL NO

12847391

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Abstract

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An improved performance management technique allows automatic determination dynamic thresholds of a metric based on a baseline of the matching pattern. A pattern matching process is conducted against a set of baseline patterns to find the matching pattern. If a matching pattern is found, the baseline of the matching pattern is used as the dynamic threshold. A series of sanity checks are performed to reduce any false alarms. If the metric does not follow any pattern, a composite of baselines is selected as the dynamic threshold.

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Patent Owner(s)

  • BMC SOFTWARE, INC.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dang, Derek San Jose, US 6 702
Lafaive, Alex Sunnyvale, US 1 324
Scarpelli, Joe Mountainview, US 11 2003
Sodem, Sridhar Cupertino, US 10 1577

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