Importance

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Abstract

The invention provides a space transformer for a probe card including an isolation resistor for isolating electrical effects between adjacent channels to perform tests on a plurality of devices under test (DUTs) formed on a wafer at one time, the space transformer including: a plurality of ceramic layers on which circuits for testing the DUTs are printed and which are stacked on one another; an isolation resistor disposed between the ceramic layers and formed by printing a resistance material so as not to be exposed to the outside. The invention also provides a method of manufacturing a space transformer for a probe card including an isolation resistor for isolating electrical effects between adjacent channels to perform tests on a plurality of devices under test (DUTs) formed on a wafer at one time, the method including the steps of: printing a resistance material to form the isolation resistor in a ceramic sheet; stacking a ceramic sheet on the ceramic sheet on which the resistance material is printed such that the resistance material is disposed between the ceramic sheets; and sintering the stacked ceramic sheets.

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First Claim