INTERCONNECT STRUCTURE AND METHOD OF MANUFACTURING A DAMASCENE STRUCTURE

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United States of America Patent

SERIAL NO

13218035

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Abstract

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An interconnect structure is provided, including a layer of dielectric material having at least one opening and a first barrier layer on sidewalls defining the opening. A ruthenium-containing second barrier layer overlays the first barrier layer, the second barrier layer having a ruthenium zone, a ruthenium oxide zone, and a ruthenium-rich zone. The ruthenium zone is interposed between the first barrier layer and the ruthenium oxide zone. The ruthenium oxide zone is interposed between the ruthenium zone and the ruthenium-rich zone.

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Patent Owner(s)

Patent OwnerAddress
LAM RESEARCH CORPORATIONFREMONT CA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arunagiri, Tiruchirapalli Fremont, US 23 247
Boyd, John M Hillsboro, US 104 1655
Dordi, Yezdi Palo Alto, US 117 2663
Redeker, Fritz C Fremont, US 55 875
Thie, William Mountain View, US 45 376
Yoon, Hyungsuk Alexander San Jose, US 59 1538

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