Low Cost Testing and Sorting of Integrated Circuits

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United States of America Patent

SERIAL NO

13270181

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Methods of testing and sorting integrated circuits in clusters are disclosed. Each cluster has power and data terminals connected to common power and data busses providing a common power supply. Each integrated circuit has a first non-volatile memory storing an activation code and a second programmable non-volatile memory that is capable of storing the activation code. If an integrated circuit passes testing, the activation code stored in the first non-volatile memory is written into the second non-volatile memory. An integrated circuit is independently functional upon separation from the cluster if the codes in the first and second non-volatile memories match. Upon separation, integrated circuits are queried to determine which respond. Each integrated circuit includes logic adapted to determine whether the codes in the first and second non-volatile memories match. If the codes do not match, the logic permanently disables the integrated circuit upon separation from the cluster.

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Patent Owner(s)

Patent OwnerAddress
ENSURGE MICROPOWER ASA2581 JUNCTION AVE SAN JOSE CA 95134

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
STEWART, Roger G Hillsborough, US 81 2490

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