RENDERING AN OPTIMIZED METRICS TOPOLOGY ON A MONITORING TOOL

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United States of America Patent

APP PUB NO 20120151396A1
SERIAL NO

12963647

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Various embodiments of systems and methods for rendering an optimized metrics topology on a monitoring tool are described herein. A monitoring tool, installed on a computer, displays a list of monitorable systems and a plurality of components of a system selected from the list. Each component is analyzed under a selected category. Each component includes a set of metrics associated with the selected category. Each metric from the set of metrics for a component is ranked. A rank for each metric is determined based upon at least a navigation behavior of a user of the monitoring tool and a metric characteristic. Based upon their ranks, the metrics are arranged in an optimized metrics topology. Higher ranked metrics are arranged in relatively higher topology level thereby delivering critical or key metrics, up front, in which the user is interested in.

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Patent Owner(s)

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SAP AG69190 WALLDORF

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
D, Raghavendra Bangalore, IN 4 54
Goradia, Chirag Mumbai, IN 1 15
Jamadagni, Vishwas Bangalore, IN 1 15
Rao, Dinesh Bangalore, IN 5 112
S, RAMPRASAD Bangalore, IN 4 30
S, Suhas Bangalore, IN 3 30

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