Comparison device and method for comparing test pattern files of a wafer tester
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United States of America Patent
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Issued Date -
Jun 21, 2012
app pub date -
Feb 18, 2011
filing date -
Dec 20, 2010
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A comparison device for comparing test pattern files of a wafer tester includes a storage unit and a processing unit. The comparison device stores a first to-be-compared file and a second to-be-compared file into the storage unit. The first to-be-compared file and the second to-be-compared file are text files respectively. The processing unit reads the first to-be-compared file and the second to-be-compared file from the storage unit to process and executes comparison operation, so as to generate a comparison result. The comparison operation is to compare the words in a first section of the first to-be-compared file with the words in a second section of the second to-be-compared file in a one-to-one manner.
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