Semiconductor element testing system having air filter

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20120212250A1
SERIAL NO

13067977

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A semiconductor element testing system having an air filter includes a testing apparatus, a first hollow frame, a fan assembly, a second hollow frame, and an air filter. The testing apparatus includes a housing having an opening. The first hollow frame is arranged on the housing and includes a flange, a bottom surface, and a side portion, wherein a plurality of hooks are fixedly arranged on the side portion. The fan assembly is fixed on the first hollow frame such that a forced airflow can be supplied toward inside of the housing. The second hollow frame includes an outer side portion fixedly arranged with a plurality of loop fasteners corresponding to the plural hooks. The air filter covers on the opening of the housing. Thereby, floating particles of the testing system can be reduced so as to lower the possibility of contamination for chips.

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Patent Owner(s)

Patent OwnerAddress
KING YUAN ELECTRONICS CO LTDNO 81 SEC 2 GONGDAOWU RD HSINCHU CITY 300

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Tai, Pi Hui Hsinchu, TW 1 0

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