METHOD OF DETECTING OR QUANTITATING ENDOGENOUS WHEAT DNA AND METHOD OF DETERMINING CONTAMINATION RATE OF GENETICALLY MODIFIED WHEAT IN TEST SAMPLE

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United States of America Patent

SERIAL NO

13366062

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Abstract

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An object of the present invention is to discover an endogenous wheat sequence satisfying the conditions of: a) it is universally present in varieties of wheat, b) the amount present (detected amount) is not affected depending on the wheat variety, c) even if other grains are present, only wheat can be detected without cross-reactivity, and d) it is amplified quantitatively by the PCR reaction. A further object of the present invention is to provide a method of accurately detecting and quantitating endogenous wheat DNA in a test sample by the polymerase chain reaction. The present invention provides a kit for detecting or quantitating an endogenous wheat DNA sequence in a test sample by the polymerase chain reaction, the kit comprising at least one primer pair capable of amplifying the endogenous wheat DNA sequence.

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NISSHIN SEIFUN GROUP INCNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Imai, Shinjiro Fujimino-shi, JP 8 25
Tanaka, Keiko Fujimino-shi, JP 30 263

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