ALIGNMENT SYSTEM FOR ELECTRONIC DEVICE TESTING
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United States of America Patent
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Issued Date -
Oct 4, 2012
app pub date -
Mar 31, 2011
filing date -
Mar 31, 2011
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
An alignment system for aligning one or more devices under test with respect to a test station includes a carrier that is configured to carry the one or more devices under test, a conveyor that is configured to move the carrier in unison with the conveyor, and an alignment structure. The alignment structure is engageable with the carrier to move the carrier with respect to the conveyor to align at least one of the devices under test with respect to the test station.
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