Wafer Level Chip Scale Package Method Using Clip Array

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United States of America Patent

SERIAL NO

13541725

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Abstract

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A method for wafer level chip scale package comprises providing a wafer with semiconductor chips formed thereon, forming a groove alongside each chip, providing a wafer size clip array with a plurality of clip contact areas each extending to a down set connecting bar, connecting the plurality of clip contact areas to a plurality of the electrodes disposed on a top surface of the chips with down set connecting bars disposed inside the grooves, encapsulating top of wafer in molding compound, thinning the bottom portion of the wafer and dicing the thin wafer into single chip packages. The chip has source and gate electrodes on a top surface connected to a first and second clip contact areas extending to a first a second down set connecting bars respectively, with the bottom surfaces of the down set connecting bars substantially coplanar to a drain electrode located at the chip bottom surface.

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Patent Owner(s)

Patent OwnerAddress
ALPHA AND OMEGA SEMICONDUCTOR (CAYMAN) LTDZEPHYR HOUSE 122 MARY STREET P O BOX 709 GRAND CAYMAN KY1-1107

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gong, Yuping Shanghai, CN 23 180

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