Ionization apparatus and ionization analysis apparatus

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United States of America Patent

SERIAL NO

13566463

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Abstract

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A sampling nozzle 21, an ion supply tube 31 leading to an analysis apparatus 50 and a barrier discharge tube 11 are connected to first, second and third ends, respectively, of a T-shaped tube 41 having three connecting ports, and the central portion of the T-shaped tube is an ionization chamber SP. The ionization chamber SP is a closed space, and ions generated therein are introduced to the analysis apparatus 50 through the ion supply tube 31. As a result, almost all of the ions are introduced into the interior of the analysis apparatus.

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Patent Owner(s)

Patent OwnerAddress
UNIVERSITY OF YAMANASHIKOFU-SHI YAMANASHI 400-8510

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Lee Chuin Kofu-shi, JP 3 111
Hiraoka, Kenzo Kofu-si, JP 15 212

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