HOME WIRING TEST SYSTEMS AND METHOD
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United States of America Patent
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Issued Date -
Dec 6, 2012
app pub date -
Jun 8, 2012
filing date -
Oct 22, 2010
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A system for testing a conductor of a structure can include a test device connected to the conductor. The test device is configured to test an electrical characteristic of the conductor and to produce a test result based at least in part on the electrical characteristic. A service provider network may be configured to communicate with the test device to initiate a test and/or to obtain the test result. A customer may use a computing device to obtain information regarding the test result, as well as guidance for troubleshooting and resolving a problem detected with the electrical conductor, such as a fault.
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