Probe module with interleaved serpentine test contacts for electronic device testing
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United States of America Patent
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Mar 3, 2015
Grant Date -
Dec 20, 2012
app pub date -
Jun 17, 2011
filing date -
Jun 17, 2011
priority date (Note) -
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status (Latency Note)
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Abstract
A probe module for testing an electronic device comprises at least two contacts, each contact including a first end portion extending in a first direction along a first line, a second end portion extending linearly in a second direction opposite from the first direction and along a second line, and a third curved portion extending between the first end portion and the second end portion. The first line is spaced apart from and in parallel with the second line, and the at least two contacts are spaced apart from each other in a direction perpendicular to the first line and the second line. Methods for making such a probe module are also taught.
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