OPTICAL MEASUREMENT SYSTEM AND THE DEVICE THEREOF
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United States of America Patent
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Issued Date -
Dec 20, 2012
app pub date -
Oct 4, 2011
filing date -
Jun 17, 2011
priority date (Note) -
Abandoned
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Abstract
The invention discloses an optical measurement system for measuring the optical properties of a device under test (DUT). The optical measurement system includes a DUT, a light measuring module, a light guiding module and an analyzing module. The present invention utilizes the light guiding module to receive an axial ray of the rays emitted by the DUT so as to analyze the optical properties thereof. Thus, the present invention is not only capable of measuring the light intensity of the rays emitted by the DUT, but also capable of obtaining the properties of the axial ray emitted by the DUT.
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